News & Insights

Stay updated with Zhihe Tongfang's latest news and industry insights

Zhihe Tongfang Makes Debut at 2024 China International Scientific Instrument Exhibition
Company News
2026/08/01

Zhite Tongfang to Showcase at 2024 China International Scientific Instrument Exhibition

Our company will showcase a range of new precision instruments at the exhibition, featuring the latest solutions for microscopic analysis and non-destructive testing.

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Trends in Semiconductor Inspection Technology: From Microns to Nanometers
Industry News
2026/08/01

Trends in Semiconductor Inspection Technology: From Micron to Nanometer Scale

Exploring the Evolution of Precision Inspection Equipment for Advanced Process Nodes

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Application of Scanning Electron Microscopy in Lithium Battery Material Research
Use Cases
2026/08/01

Applications of Scanning Electron Microscopy in Lithium Battery Material Research

Analyze the microstructure and interface of cathode materials using field-emission SEM.

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Daily Maintenance and Care Guide for Metallographic Microscopes
Technical Articles
2026/08/01

Daily Maintenance and Care Guide for Metallographic Microscopes

Key Maintenance Tips and Troubleshooting for Extending Device Lifespan

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Application of Industrial CT in Aviation Engine Blade Inspection
Use Cases
2026/08/01

Application of Industrial CT in Aero-engine Blade Inspection

Non-destructive testing of turbine blade internal defects using micro-focus CT

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Jing ICP Prep 2025035698 No. -1