Product Center
Nine product categories covering a complete solution from micro-scale observation to non-destructive testing.
ZEISS Smartzoom 5 Digital Microscope
Simplify inspection: an automated digital microscope for routine testing and failure analysis. ZEISS Smartzoom 5 is Zeiss' next-generation intelligent digital microscope, designed specifically for quality assurance applications in industry. The system features a unique professional QA/QC hardware design that integrates zooming, panoramic imaging, and coaxial illumination into a single unit. With intelligent workflows and output capabilities, it offers simple operation—enabling even untrained users to quickly master the system and achieve excellent inspection results.
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MX4R / MX6R / MX8R Semiconductor Inspection Microscopes
A series of inspection microscopes designed specifically for the semiconductor industry, offering MX4R, MX6R, and MX8R models to meet wafer inspection needs for 4-inch, 6-inch, and 8-inch wafers. Equipped with an infinity-corrected achromatic optical system, it supports brightfield and darkfield reflected illumination, polarized light observation, and differential interference contrast (DIC). Motorized objective lens switching enhances efficiency, making this a cost-effective solution for semiconductor wafer inspection.
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MX12R / MX68R Semiconductor Inspection Microscope
High-performance inspection microscope engineered for the semiconductor industry. The 12-inch oversized platform accommodates large-wafer inspections, while ergonomic design enhances operator comfort. Motorized objective switching boosts efficiency, and the system supports brightfield/darkfield reflection illumination with a rotary stage—making it the ideal choice for semiconductor wafer inspection. Available in MX12R and MX68R models.
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RX50M Research-Grade Metallographic Microscope
The all-new RX50M research-grade metallurgical microscope integrates multiple first-of-its-kind innovations from Sunny Optical. With an appearance and performance aligned with global leading design trends, it aims to redefine the industrial landscape. Featuring a wide-beam imaging system, it supports 26.5mm world-class ultra-wide field of view observation and offers versatile modes including reflected brightfield, reflected darkfield, transmitted brightfield, transmitted-reflected polarized light, and reflected differential interference contrast (DIC).
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PA200/300MET Semiconductor Microscope
Bright, clear, and perfect. The optimized rack structure features a low center of gravity, high rigidity, and exceptional stability, significantly enhancing vibration resistance to ensure consistent image quality. Ideal for industrial-scale sample inspection, particularly in the semiconductor wafer and LCD display industries. Available in two models: PA200MET (8-inch stage) and PA300MET (12-inch stage), supporting brightfield, darkfield, and transmitted light configurations.
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DMS1000 Super Depth of Field Microscope
Ultra-high-resolution, ultra-depth-of-field microscope imaging system. Professional APO telecentric objectives enable rapid magnification switching from 20X to 7500X. Integrated with a 360° observation system, high-precision XYZ motorized stage, and multiple illumination modes, it delivers optimal image quality and one-click 2D-to-3D measurement analysis. Available in three models: high-resolution, monocular, and metallurgical.
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