Product Center

Nine product categories covering a complete solution from micro-scale observation to non-destructive testing.

Zeiss LSM 910
3D Optical Profiler

Zeiss LSM 910

The Zeiss LSM 910 is a high-performance laser scanning confocal microscope that combines the core principles of confocal imaging with cutting-edge innovation. Its efficient optical path delivers nanometer-precision spectral flexibility, while Airyscan super-resolution imaging enables low phototoxicity, high-resolution observation. Lightfield 4D ultrafast volumetric imaging captures dynamic biological processes at speeds of up to 80 volumes per second. With LSM Plus linear Wiener deconvolution further enhancing image quality across all confocal modes, it is the ideal tool for life sciences research.

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Zeiss LSM 990
3D Optical Profiler

Zeiss LSM 990

The Zeiss LSM 990 is a high-end, multi-functional laser scanning confocal microscope that breakthroughly integrates multiple imaging technologies. With super-resolution imaging down to 90 nm (Airyscan 2), high-speed volumetric imaging at 80 volumes per second (Lightfield 4D), full-spectrum detection from 380 to 900 nm (up to 36 detection channels, simultaneously resolving more than 10 fluorescent labels), multiphoton excitation for deep-tissue imaging, and molecular dynamics analysis (FCS/FLIM/FRAP/FRET), it delivers comprehensive research capabilities across all levels of life sciences—from molecules to tissues.

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ZEISS LSM 900 Laser Scanning Confocal Microscope
3D Optical Profiler

ZEISS LSM 900 Laser Scanning Confocal Microscope

The ZEISS LSM 900 is Zeiss's next-generation high-end laser scanning confocal microscope, designed for materials research and analysis. The system features a 405nm UV laser module with lateral resolution up to 120nm and a maximum scan resolution of 6144×6144 pixels. Equipped with C Epiplan-APOCHROMAT high-performance objectives and ConfoMap surface analysis software, it supports brightfield, darkfield, C-DIC, polarized light, fluorescence, and other observation modes. It is the ideal tool for surface morphology analysis in materials science, manufacturing, forensics, geology, and life sciences.

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Shixin Optical T100 Domestic 3D Profiler
3D Optical Profiler

Shixin Optical T100 Domestic 3D Profilometer

The Shixin Optical T100 is a high-end domestic 3D optical profiler developed by Shanghai Shixin Jizhi Technology Co., Ltd. It integrates three measurement principles: interferometry, confocal microscopy, and AI-based multi-focus stacking. With a compact design and plug-and-play capability, it supports large-area stitching measurements up to 125×75 mm, features a 6-position motorized nosepiece with multiple objective lenses, complies with ISO 25178 standards, and is ideal for surface texture and dimensional metrology in aerospace, automotive, electronics, and medical device applications.

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Sensofar S Lynx Compact Multi-Function Optical Profiler
3D Optical Profiler

Sensofar S Lynx Compact Multi-Function Optical Profilometer

The S Lynx is a compact, multi-functional optical profiler from the Sensofar ecosystem. It integrates AI-driven multi-focal stacking, confocal, and interferometry technologies into a small form factor that fits in the tightest spaces. Supporting seamless stitching for large-area measurements up to 125×75 mm, it processes data directly within the probe head for plug-and-play operation. Ideal for surface texture and dimensional metrology in semiconductors, automotive, electronics, MEMS, and battery applications.

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Sensofar S neox: Next-Gen High-End 3D Optical Profilometer
3D Optical Profiler

Sensofar S neox 3D: Next-Generation High-End 3D Optical Profilometer

High-precision, ultra-fast, wide-range, fully automated — the expert in 3D surface topography measurement. The Sensofar neox is our next-generation high-end 3D optical profiler, integrating confocal microscopy, PSI/CSI interferometry, AI multi-focus stacking, and film thickness measurement into a single unit. With no moving parts, it achieves data acquisition speeds up to 180fps, vertical resolution down to 0.001nm, and complies with ISO 25178/4287 standards. Ideal for surface metrology in semiconductor manufacturing, precision machining, medical devices, and tribology applications.

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Jing ICP Prep 2025035698 No. -1